Electronic apparatus and appliances -- Testing

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• Electronic apparatus and appliances
• Testing

• Liquid level indicators -- Testing
• Metal detectors -- Testing
• Miniature electronic equipment -- Testing
• Probes (Electronic instruments)
• Signal generators
• Transducers -- Testing
• Electronic apparatus and appliances -- United States -- Testing
• Electronic apparatus and appliances -- Vibration -- Testing

• Handbook of test methods and practices [on the fundamentals of testing electronic equipment] (Washington, Dept. of the Navy, Bureau of Ships, [1956]), by Philco Corporation (page images at HathiTrust)
• Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures / Michael A. Mitchell, Loren W. Linholm sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981), by Michael A. Mitchell (page images at HathiTrust)
• Microelectronic test patterns: an overview / [by] Martin G. Buehler. ([Washington, D.C.] : National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.], 1974), by Martin G. Buehler (page images at HathiTrust)
• Materiel fielding plan (MFP) for the signal generator model 8340B. (Washington, D.C. : Dept. of the Navy, Headquarters U.S. Marine Corps, 1992), by United States Marine Corps (page images at HathiTrust)

• Temperature and liquid-level sensor for liquid-hydrogen pressurization and expulsion studies / by Robert J. Stochl and Richard L. DeWitt. (Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : For sale by the Clearinghouse for Federal Scientific and Technical Information, [1968]), by Robert J. Stochl (page images at HathiTrust)

• Tests of hand-held metal weapon detectors / [prepared by the Law Enforcement Standards Laboratory]. (Washington : U.S. Dept. of Justice, Law Enforcement Assistance Administration, National Institute of Law Enforcement and Criminal Justice : For sale by the Supt. of Docs., U.S. Govt. Print. Off., [Congressional Sales Office], 1977), by Law Enforcement Standards Laboratory (page images at HathiTrust)

• Notes on SEM examination of microelectronic devices / John R. Devaney, K.O. Leedy, and W.J. Keery. ([Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Doc., U.S. Govt. Print. Off., 1977), by John R. Devaney (page images at HathiTrust)

• Measurement of backscattered electrons in an electron probe microanalyzer / by Philip G. Burkhalter. ([Washington, D.C.] : U.S. Dept. of the Interior, Bureau of Mines, 1965), by Philip G. Burkhalter (page images at HathiTrust)
• Spectrochemical analysis: optical spectrometry, X-ray fluorescence spectrometry, and electron prope microanalysis techniques. (Washington, For sale by the Superintendent of Documents, [U.S.] Govt. Print. Off., 1965-), by United States. National Bureau of Standards. Spectrochemical Analysis Section (page images at HathiTrust)
• Use of the wire loop in locating the orbital surface of a cyclotron field / Glen R. Lambertson. (Berkeley, Ca. : Lawrence Radiation Laboratory, 1956), by Glen R. Lamberston (page images at HathiTrust)
• Ball potential detector / by C. N. Winningstad. (Berkeley, Ca. : [Lawrence] Radiation Laboratory. Oak Ridge, Tn. : Technical Information Division, 1952), by C. N. Winningstad (page images at HathiTrust)
• Effect of number of probes and their orientation on the calculation of several compressor face distortion descriptors / Frederick Stoll, Jeffrey W. Tremback, and Henry H. Arnaiz. (Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Office ; [Springfield, Va. : For sale by the National Technical Information Service], 1979), by Frederick Stoll (page images at HathiTrust)
• A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins. ([Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981), by G. P. Carver (page images at HathiTrust)
• A wafer chuck for use between -196 and 350⁰C / R.Y. Koyama and M.G. Buehler. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), by R. Y. Koyama (page images at HathiTrust)
• Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics / A. Christou. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978), by A. Christou (page images at HathiTrust)
• Characterization of a high frequency probe assembly for integrated circuit measurements / R.L. Jesch [and] C.A. Hoer. ([Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975), by R. L. Jesch (page images at HathiTrust)
• Pressure probe and hot-film probe responses to acoustic excitation in mean flow / Tony L. Parrott, Michael G. Jones. (Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1986), by Tony L. Parrott (page images at HathiTrust)
• A theoretical and experimental investigation of cylindrical electrostatic probes at arbitrary incidence in flowing plasma / by Renaldo V. Jenkins and W. Linwood Jones, Jr. (Washington, D.C. : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service], 1974), by Renaldo V. Jenkins (page images at HathiTrust)
• Mach 1 oxidation of thoriated nickel chromium at 1204⁰ C (2200⁰ F) Carl E. Lowell and William A. Sanders. (Washington, D.C. : National Aeronautics and Space Administration ; [For sale for Federal Scientific and Technical Information, Springfield, Virginia 22151], 1971), by Carl E. Lowell (page images at HathiTrust)
• Some limitations on the use of damping in short pressure probes / Ted W. Nyland and Robert C. Anderson. (Washington, D.C. : National Aeronautics and Space Administration ; [For sale by the Clearinghouse for Federal Scientific and Technical, Springfield, Virginia 22151], 1971), by Ted W. Nyland (page images at HathiTrust)
• An efficient coding system for deep space probes with specific application to pioneer missions / Dale R. Lumb, Lary B. Hofman. (Washington, D. C. : National Aeronautics and Space Administration ; Springfield, Va. : for sale by the Clearinghouse for Federal Scientific and Technical Information, 1967), by Dale R. Lumb (page images at HathiTrust)
• Analytical investigation of an inflatable landing system having omnidirectional and multiple-impact capabilities / John R. McGehee, Melvin E. Hathaway, and Cornelia B. Dexter. (Washington, D.C. : National Aeronautics and Space Administration ; [For sale by the Clearinghouse for Federal Scientific and Technical, Springfield, Virginia 20230], 1969), by John R. McGehee (page images at HathiTrust)
• Preparation and homogeneity characterization of an austenitic iron-chromium-nickel alloy [by] Harvey Yakowitz, Arthur W. Ruff, and Robert E. Michaelis, Institute for Materials Research, National Bureau of Standards. (Washington, National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.], 1972), by Harvey Yakowitz (page images at HathiTrust; US access only)

• Theoretical derivation and calibration technique of a hemispherical-tipped, five-hole probe / Scott O. Kjelgaard. (Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Division ; Springfield, Va. : For sale by the National Technical Information Service, 1988), by Scott O. Kjelgaard (page images at HathiTrust)

• Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / edited by K. F. J. Heinrich and D. E. Newbury. (Washington : U. S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U. S. Govt. Print. Off., 1975), by Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis, (page images at HathiTrust)

• Characterization of lateritic nickel ores by electron-optical and x-ray techniques / by D. Chandra, C.O. Ruud, and R.E. Siemens. ([Avondale, Md.] : U.S. Dept. of the Interior, Bureau of Mines, [1983]), by D. Chandra (page images at HathiTrust)
• A rigorous correction procedure for quantitative electron probe microanalysis (COR 2) / Jean H©Øenoc and Kurt F.J. Heinrich and Robert L. Myklebust. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards, 1973), by Jean H©Øenoc (page images at HathiTrust)
• Scanning electron probe microanalysis / Kurt F.J. Heinrich. (Washington, D.C. : U.S. National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1967), by Kurt F. J. Heinrich (page images at HathiTrust)
• Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy : proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, Maryland, October 1-3, 1975 / edited by K.F.J. Heinrich, D.E. Newbury, and H. Yakowitz ; sponsored by Analytical Chemistry Division, Institute for Materials Research, National Bureau of Standards. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976), by Workshop on the Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy (page images at HathiTrust)
• Frame C : a compact procedure for quantitative energy-dispersive electron probe X-ray analysis / R.L. Myklebust, C.E. Fiori, and K.F.J. Heinrich. (Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), by Robert L. Myklebust (page images at HathiTrust)
• Present state of the classical theory of quantitative electron probe microanalysis / Kurt F.J. Heinrich. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards, 1970), by Kurt F. J. Heinrich (page images at HathiTrust)
• FRAME : an on-line correction procedure for quantitative electron probe microanalysis / H. Yakowitz and R.L. Myklebust and K.F.J. Heinrich. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards, 1973), by Harvey Yakowitz (page images at HathiTrust)
• An electron microprobe study of inclusions in lead telluride thermoelectric elements / by Donald B. Evans and Lawrence Kobren. (Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : For sale by the Clearinghouse for Federal Scientific and Technical Information, [1969]), by Donald Beers Evans (page images at HathiTrust)
• Traveling probe for ZPR-II / by D.F. Uecker. (Oak Ridge, Tenn. : United States Atomic Energy Commission, Technical Information Service ; [Washington, D.C. : Available from the Office of Technical Services, Dept. of Commerce, 1955]), by D. F. Uecker (page images at HathiTrust)
• A simple correction procedure for quantitative electron probe microanalysis / Kurt F.J. Heinrich ... [et al.]. (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards, 1972) (page images at HathiTrust)

• A computer program for electron probe microanalysis / by James D. Brown. ([Washington, D.C.] : U.S. Dept. of the Interior, Bureau of Mines, 1965), by James D. Brown (page images at HathiTrust)

• The use of the electron probe microanalyzer in materials research and development / Lawrence Kobren. (Washington, D. C. : National Aeronautics and Space Administration ; Springfield, Va. : for sale by the Clearinghouse for Federal Scientific and Technical Information, 1968), by Lawrence Kobren (page images at HathiTrust)

• X-ray micrography of alpha plutonium / E. M. Cramer. (Livermore, Ca. : Lawrence Radiation Laboratory, 1964), by E. M. Cramer (page images at HathiTrust)
• Fractographic and microstructural analysis of stress corrosion cracking of A533 Grade B Class 1 plate and A508 Class 2 forging in pressurized reactor-grade water at 93C̊ / V. Provenzano ... [et al.]. (Washington, D.C. : Naval Research Laboratory, [1980]) (page images at HathiTrust)

• A portable pulse generator / by E.W. Titterton. (Oak Ridge, Tenn. : Atomic Energy Commission, [1947]), by E. W. Titterton (page images at HathiTrust)
• Application of RF micropotentiometers for calibration of signal generators to 1000 Mc / by L. F. Behrent. (Washington, D. C. : U.S. Dept. of Commerce, National Bureau of Standards ; U.S. Govt. Print. Off., 1960), by Lewis F. Behrent (page images at HathiTrust)
• Materiel fielding plan (MFP) for the signal generator model 8340B. (Washington, D.C. : Dept. of the Navy, Headquarters U.S. Marine Corps, 1992), by United States Marine Corps (page images at HathiTrust)

• Direct support and general support maintenance repair parts and special tools list for signal generator, Hewlett-Packard model 8640BOPTION 001 (NSN 4931-00-545-2344). ([Washington, D.C.] : Headquarters, Dept. of the Army, 1984-) (page images at HathiTrust)
• RF signal generator AN/URM-25F. ([Washington, D.C.] : Dept. of the Army, [1990-) (page images at HathiTrust)
• Organizational, field, and depot maintenance manual : signal generators AN/USM-44 and AN/USM-44A. ([Washington, D.C.] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Operator's, organizational, direct support, and general support maintenance manual : signal generator AN/USM-44B (NSN 6625-00-176-5708). ([Washington, DC] : Headquarters, Dept. of the Army, [1992]) (page images at HathiTrust)
• Operator and organizational maintenance manual including repair parts and special tools lists : generator, signal sweep AN/USM-203, (NSN 6625-00-935-0145). ([Washington, D.C.] : Headquarters, Dept. of the Army, [1969-) (page images at HathiTrust)
• Organizational, direct support and general support maintenance repair parts and special tools list (including depot maintenance repair parts and special tools) for signal generator SG-1144/U, (NSN 6625-01-075-8478). ([Washington, DC] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Organizational, direct support and general support maintenance repair parts and special tools lists (including depot maintenance repair parts and special tools) for signal generator AN/URM-206, (NSN 6625-01-077-8503). ([Washington, DC] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Organizational, direct support, and general support maintenance repair parts and special tools lists (including depot maintenance repair parts and special tools) for signal generator AN/URM-170 (NSN 6625-00-883-3256). ([Washington, DC] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Operator's and organizational maintenance manual : test set, receiver AN/ARM-180, (NSN 6625-01-041-4161). ([Washington, DC] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Organizational, direct support, and general support maintenance ... for generator, signal, AN/GRM-50C (NSN 6625-00-003-3238). ([Washington, DC] : Headquarters, Dept. of the Army, [1990]) (page images at HathiTrust)
• Operator's, organizational, direct support, and general support maintenance manual ... : generator, sweep signal, AN/USM-203A. ([Washington, DC] : Headquarters, Dept. of the Army, [1990]) (page images at HathiTrust)
• Operator's, organizational, direct support, and general support maintenance manual : signal generator AN/USM-44C (NSN 6625-00-138-7773). ([Washington, DC] : Headquarters, Dept. of the Army, [1990]) (page images at HathiTrust)
• Organizational, direct support, and general support maintenance repair parts and special tools lists ... for generator, signal AN/URM-103 (NSN 6625-00-868-8352). ([Washington, DC] : Headquarters, Dept. of the Army, [1992]) (page images at HathiTrust)
• Organizational, DS, GS, and depot maintenance manual : generator, signal, AN/USM-205. ([Washington, DC] : Headquarters, Dept. of the Army, [1992]) (page images at HathiTrust)
• Operator's and organizational maintenance manual : signal generator SG-1171/U, (NSN 6625-01-133-6160). ([Washington, DC] : Headquarters, Dept. of the Army, 1985-) (page images at HathiTrust)
• Organizational, direct support, and general support maintenance repair parts and special tools list (including depot maintenance repair parts and special tools) for signal generator SG-1171/U, (NSN 6625-01-133-6160). ([Washington, DC] : Headquarters, Dept. of the Army, [1989-) (page images at HathiTrust)
• Operator and organization maintenance manual : generator signal SG-298/U. ([Washington, D.C.] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Operator's and organizational maintenance : pulse signal generator SG-1205(V)1/U (NSN 6625-01-137-5369). ([Washington, DC] : Headquarters, Dept. of the Army, [1990]) (page images at HathiTrust)
• Operator's and organizational maintenance manual for signal generators AN/URM-52 (NSN 6625-00-556-8107), AN/URM-52A (NSN 6625-00-592-5742), AN/URM-52B (NSN 6625-00-965-1501). ([Washington, DC] : Headquarters, Dept. of the Army, [1992]) (page images at HathiTrust)
• Operator's, organizational, and direct support maintenance manual : synthesized signal generator, Ailtech model 382M. ([Washington, DC] : Dept. of the Army, 1986-) (page images at HathiTrust)
• Organizational, direct support and general support maintenance repair parts and special tools list for signal generator SG-1219/U, (NSN 6625-01-188-7441). ([Washington, DC] : Headquarters, Dept. of the Army, 1986-) (page images at HathiTrust)
• Organizational, direct support, and general support maintenance repair parts and special tools lists (including depot maintenance repair parts and special tools) for signal generator AN/URM-127 (NSN 6625-00-783-5965). ([Washington, DC] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Operator, organizational, DS, GS, and depot maintenance manual : signal generators SG-71/FCC, SG-71A/FCC, SG-71B/FCC, and SG-71C/FCC. ([Washington, D.C.] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Organizational, DS, GS, and depot maintenance manual : test set TS-140/PCM : signal generator SG-15/PCM and SG-15A/PCM, and decibel meter ME-22/PCM and ME-22A/PCM. ([Washington, D.C.] : Headquarters, Dept. of the Army, [1990-) (page images at HathiTrust)
• Organizational, direct support, and general support maintenance ... for generator, test pattern SG-1223/T (NSN 6625-01-127-6846). ([Washington, DC] : Departments of the Army, Navy, and Air Force, [1990]) (page images at HathiTrust)
• Operator's, organizational, direct support, and general support maintenance manual : signal generators SG-299/U (NSN 6625-00-624-3516), SG-299A/U (NSN 6625-00-897-0060) ... and SG-299E/U. ([Washington, DC] : Headquarters, Dept. of the Army, [1991]) (page images at HathiTrust)

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