|Title:||Measurement of transistor scattering parameters / George J. Rogers and David E. Sawyer, Ramon L. Jesch.|
|Author:||Rogers, George J.|
|Note:||[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975|
|Link:||page images at HathiTrust|
|No stable link:||This is an uncurated book entry from our extended bookshelves, readable online now but without a stable link here. You should not bookmark this page, but you can request that we add this book to our curated collection, which has stable links.|
|Subject:||Transistors -- Testing|
|Other copies:||Look for editions of this book at your library, or elsewhere.|
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