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Nanoscopy on-a-chip: super-resolution imaging on the millimeter scale

Helle, Øystein I; Coucheron, David A; Tinguely, Jean-Claude …

Optics express, 2019-03, Vol.27 (5), p.6700-6710

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On-chip TIRF nanoscopy by applying Haar wavelet kernel analysis on intensity fluctuations induced by chip illumination

Jayakumar, Nikhil; Helle, Øystein I; Agarwal, Krishna …

Optics express, 2020-11, Vol.28 (24), p.35454-35468

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Silicon substrate significantly alters dipole-dipole resolution in coherent microscope

Liu, Zicheng; Agarwal, Krishna

Optics express, 2020-12, Vol.28 (26), p.39713-39726

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