Spectrométrie de masse des ions secondaires
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- Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / (Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975), by Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis (1974 : National Bureau of Standards), Dale E. Newbury, and Kurt F. J. Heinrich (page images at HathiTrust)
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