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X-ray diffractometer

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• X-rays -- Equipment and supplies

• Diffractometer, X-ray

• Separation and identification of the silt-sized heavy-mineral fraction in sediments / (Washington, D.C. : U.S. G.P.O. ; Denver, CO : Free on application to Book and Open-File Report Sales, U.S. Geological Survey, 1992), by Judith A. Commeau, R. F. Commeau, and Lawrence J. Poppe (page images at HathiTrust)
• Radiation safety for X-ray diffraction and fluorescence analysis equipment / (Washington : The Bureau ; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978), by American National Standards Institute. Subcommittee N43-1 (page images at HathiTrust)
• Optical properties and X-ray diffraction data for some inorganic fluoride and chloride compounds / (Oak Ridge, Tenn. : Oak Ridge National Laboratory, 1956), by G. D. White, R. E. Thoma, T. N. McVay, H. Insley, U.S. Atomic Energy Commission, and Oak Ridge National Laboratory Chemistry Division Metallurgy Division (page images at HathiTrust)
• A single-crystal adapter for the Norelco wide-range diffractometer / (Oak Ridge, Tenn. : Oak Ridge National Laboratory ;, [1955]), by R. J. Fox, M. C. Wittels, F. A. Sherrill, Oak Ridge National Laboratory, and U.S. Atomic Energy Commission (page images at HathiTrust)
• High temperature and high pressure x-ray studies of uranium hydride : progress report for March 17, 1955 to October 17, 1955 /, by Edward Goon, Thomas R. P. Gibb, U.S. Atomic Energy Commission. New York Operations Office, and Tufts University (page images at HathiTrust)
• Routine quantitative analysis by x-ray diffraction / (Washington, D.C. : U.S. Dept. of the Interior, Bureau of Mines, 1946), by James W. Ballard and H. H. Schrenk (page images at HathiTrust)
• Phase equilibria in the system NaF-ThF₄-UF₄ / (Oak Ridge, Tenn., Oak Ridge National Laboratory, 1963), by C. F. Weaver, H. A. Friedman, G. M. Hebert, Herbert Insley, R. E. Thoma, U.S. Atomic Energy Commission, and Oak Ridge National Laboratory. Reactor Chemistry Division (page images at HathiTrust)
• Angle calculations for 3- and 4-circle x-ray and neurron diffractometers / (Oak Ridge, Tenn. : Oak Ridge National Laboratory, 1967), by William R. Busing, Henri A. Levy, Oak Ridge National Laboratory, and U.S. Atomic Energy Commission (page images at HathiTrust)
• X-ray diffractometer studies of some vanadium silicates /, by John C Hathaway and Geological Survey (U.S.) (page images at HathiTrust)
• Operation of an x-ray and a neutron diffractometer controlled by a non-dedicated computer system /, by D. J. Dahm, R. A. Jacobson, D. R. Fitzwater, D. M. Nimrod, J. E. Benson, issuing body Ames Laboratory, and issuing body U.S. Atomic Energy Commission (page images at HathiTrust)
• Some specialized attachments for the Siemens x-ray diffractometer /, by John J. Renton, William L. Baun, and issuing body United States. Air Force. Systems Command. Aeronautical Systems Division (page images at HathiTrust)

Items below (if any) are from related and broader terms.