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X-ray microanalysis

See also what's at your library, or elsewhere.

• Microprobe analysis

• Fractographic and microstructural analysis of stress corrosion cracking of A533 Grade B Class 1 plate and A508 Class 2 forging in pressurized reactor-grade water at 93C̊ / (Washington, D.C. : Naval Research Laboratory, [1980]), by V. Provenzano, U.S. Nuclear Regulatory Commission, and Naval Research Laboratory (U.S.). Thermostructural Materials Branch (page images at HathiTrust)
• X-ray micrography of alpha plutonium / (Livermore, Ca. : Lawrence Radiation Laboratory, 1964), by E. M. Cramer and Lawrence Radiation Laboratory (page images at HathiTrust)
• Fractographic and microstructural analysis of fatigue specimens of A302 grade B steel tested in air at room temperature /, by G Gabetta, V Provenzano, U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research, Naval Research Laboratory (U.S.). Thermostructural Materials Branch, and U.S. Nuclear Regulatory Commission (page images at HathiTrust)

Items below (if any) are from related and broader terms.

• Mass spectrometer analysis of solid materials with the ion-microprobe sputter source / (Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : For sale by the Clearinghouse for Federal Scientific and Technical Information, 1967), by R. F. K. Herzog, Frank G. Satkiewicz, W. P. Poschenrieder, Goddard Space Flight Center, and United States National Aeronautics and Space Administration (page images at HathiTrust)
• Micro-homogeneity studies of NBS standard reference materials, NBS research materials, and other related samples / ([Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), by R. B. Marinenko, F. C. Ruegg, Kurt F. J. Heinrich, and United States. National Bureau of Standards (page images at HathiTrust)
• Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / (Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975), by Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis (1974 : National Bureau of Standards), Dale E. Newbury, and Kurt F. J. Heinrich (page images at HathiTrust)
• Fluorine atom probe techniques for chemical lasers / (Hanscom AFB, Mass. : Air Force Cambridge Research Laboratories, Air Force Systems Command, United States Air Force, 1975), by H. R. Schlossberg and Air Force Cambridge Research Laboratories (U.S.) (page images at HathiTrust)

• Two-probe measurement of the parameters of a high-frequency electrodeless discharge / ([Place of publication not identified] : [U.S. Atomic Energy Commission], [1951?]), by L. M. Biberman, B. Panin, and U.S. Atomic Energy Commission (page images at HathiTrust)
• Electron and ion microprobes applied to characterize an aluminide coating on IN-100 / (Washington, D.C. : National Aeronautics and Space Administration ; Springfield, VA : For sale by the Clearinghouse for Federal Scientific and Technical Information, 1971), by Robert M. Caves, Salvatore J. Grisaffe, Lewis Research Center, and United States National Aeronautics and Space Administration (page images at HathiTrust; US access only)
• Combined electron microscope, electron diffraction, and electron microprobe analysis of identical microstructures in the debond area of a dissimilar metal joint / (Washington, D.C. : National Aeronautics and Space Administration ; Springfield, VA : For sale by the Clearinghouse for Federal Scientific and Technical Information, 1971), by L. G. Bostwick, R. Burton, John F. Kennedy Space Center, and United States National Aeronautics and Space Administration (page images at HathiTrust; US access only)
• The use of the electron probe microanalyzer in materials research and development / (Washington, D. C. : National Aeronautics and Space Administration ; Springfield, Va. : for sale by the Clearinghouse for Federal Scientific and Technical Information, 1968), by Lawrence Kobren, Goddard Space Flight Center, and United States National Aeronautics and Space Administration (page images at HathiTrust)
• An electron microprobe study of inclusions in lead telluride thermoelectric elements / (Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : For sale by the Clearinghouse for Federal Scientific and Technical Information, [1969]), by Donald Beers Evans, Lawrence Kobren, United States National Aeronautics and Space Administration, and Goddard Space Flight Center (page images at HathiTrust)
• A Simple correction procedure for quantitative electron probe microanalysis / (Washington : U.S. National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1972), by Kurt F. J. Heinrich (page images at HathiTrust)
• Frame C : a compact procedure for quantitative energy-dispersive electron probe X-ray analysis / (Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), by Robert L. Myklebust, Kurt F. J. Heinrich, C. E. Fiori, National Measurement Laboratory (U.S.), and United States. National Bureau of Standards. Technical note (page images at HathiTrust)
• FRAME : an on-line correction procedure for quantitative electron probe microanalysis / (Washington : U.S. National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1973), by Harvey Yakowitz, Kurt F. J. Heinrich, and Robert L. Myklebust (page images at HathiTrust)
• A rigorous correction procedure for quantitative electron probe microanalysis (COR 2) / (Washington : U.S. National Bureau of Standards : For sale by, the Supt. of Docs., U.S. Govt. Print. Off., 1973), by Jean Hénoc, Kurt F. J. Present State of the classical theory of quantitative electron probe microanalysis Heinrich, Robert L. Myklebust, and Kurt F. J. Heinrich (page images at HathiTrust)
• Present state of the classical theory of quantitative electron probe microanalysis / (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards, 1970), by Kurt F. J. Heinrich, United States. National Bureau of Standards. Analytical Chemistry Division. Spectrochemical Analysis Division, and United States. National Bureau of Standards. Technical note (page images at HathiTrust)
• Characterization of lateritic nickel ores by electron-optical and x-ray techniques / ([Avondale, Md.] : U.S. Dept. of the Interior, Bureau of Mines, [1983]), by D. Chandra, R. E. Siemens, and C. O. Ruud (page images at HathiTrust)
• A computer program for electron probe microanalysis / ([Washington, D.C.] : U.S. Dept. of the Interior, Bureau of Mines, 1965), by James D. Brown and United States Bureau of Mines (page images at HathiTrust)
• Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy : proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, Maryland, October 1-3, 1975 / (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976), by Workshop on the Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy (1975 : National Bureau of Standards), Harvey Yakowitz, Dale E. Newbury, Kurt F. J. Heinrich, and United States. National Bureau of Standards. Special publication (page images at HathiTrust)
• Scanning electron probe microanalysis / (Washington : U.S. National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1967), by Kurt F. J. Heinrich (page images at HathiTrust)
• Traveling probe for ZPR-II / (Oak Ridge, Tenn. : United States Atomic Energy Commission, Technical Information Service ; [Washington, D.C. : Available from the Office of Technical Services, Dept. of Commerce, 1955]), by D. F. Uecker, U.S. Atomic Energy Commission, University of Chicago, and Argonne National Laboratory (page images at HathiTrust)
• Microprobe study of zircaloy corrosion films / (Aiken, S.C. : E.I. du Pont de Nemours & Co., Savannah River Laboratory, [1964]), by Kurt F. J. Heinrich, U.S. Atomic Energy Commission, Savannah River Laboratory, and E.I. du Pont de Nemours & Company (page images at HathiTrust)
• The correction for fluorescence by characteristic radiation in microprobe analysis /, by J. W. Colby, U.S. Atomic Energy Commission, and National Lead Company of Ohio. Feed Materials Production Center (page images at HathiTrust; US access only)