| Title: | Ellipsometry in the measurement of surfaces and thin films : symposium proceedings. |
| Author: | Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.) |
| Author: | Kruger, Jerome |
| Author: | Stromberg, R. R. |
| Author: | Passaglia, Elio |
| Note: | U.S. National Bureau of Standards, 1964 |
| Link: | page images at HathiTrust; US access only |
| No stable link: | This is an uncurated book entry from our extended bookshelves, readable online now but without a stable link here. You should not bookmark this page, but you can request that we add this book to our curated collection, which has stable links. |
| Subject: | Polarization (Light) |
| Subject: | Surfaces (Technology) |
| Subject: | Thin films |
| Other copies: | Look for editions of this book at your library, or elsewhere. |
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