| Title: | Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system |
| Author: | Carreno, Victor A. |
| Author: | Iyer, R. K. |
| Author: | Choi, G. |
| Author: | Langley Research Center |
| Note: | National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ;, 1990 |
| Link: | page images at HathiTrust |
| No stable link: | This is an uncurated book entry from our extended bookshelves, readable online now but without a stable link here. You should not bookmark this page, but you can request that we add this book to our curated collection, which has stable links. |
| Subject: | Digital avionics -- Computer simulation |
| Subject: | Fault-tolerant computing |
| Subject: | System failures (Engineering) -- Computer simulation |
| Subject: | Transients (Electricity) -- Computer simulation |
| Other copies: | Look for editions of this book at your library, or elsewhere. |
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