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Automated data collection system applied to Hall effect and resistivity measurements /

Title:Automated data collection system applied to Hall effect and resistivity measurements /
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Note:Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : For sale by the Clearinghouse for Federal Scientific and Technical Information [distributor], 1967
  
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Subject:Thin films
Subject:Silicon
Subject:Data acquisition
Subject:Cryogenic equipment
Subject:Cadmium sulfides
Subject:Transport properties
Subject:Semiconductors
Subject:Hall effect
Subject:Electrical resistivity
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