You requested books by authors starting with "Schott, J. T.", and with titles starting with "Transient capacitance measurement of deep defect levels in GaAs and Si". (Exclude extended shelves)
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Schott, J. T.: Transient capacitance measurement of deep defect levels in GaAs and Si (Air Force Cambridge Research Laboratories, Air Force Systems Command, United States Air Force, 1976), also by W. R. White, H. M. DeAngelis, and Air Force Cambridge Research Laboratories (U.S.) (page images at HathiTrust)1 item was found.
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