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Crowl, Daniel A.
Upper Saddle River, N.J.: Prentice Hall PTR, 2002.
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New York : American Institute of Chemical Engineers, 1999.
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Conference on Activated Sludge Process Control (1st : 1981 : Chicago, Ill.)
Ann Arbor, Mich. : Ann Arbor Science Publishers, 1982.
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Conference on Glass Problems (49th : 1988 : Ohio State University)
Westerville, OH : American Ceramic Society, ©1989.
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International Symposium on the Harmonization of Internal Quality Assurance Schemes for Analytical Laboratories (5th : 1993 : Washington, D.C.)
Cambridge : Royal Society of Chemistry, c1993.
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Washington, DC : American Chemical Society, c1994.
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Arthur, Robert M.
Fond Du Lac, Wis. : Arthur Technology ; Ann Arbor, Mich. : Ann Arbor Science Publishers, 1982.
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Box, George E. P.
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Washington, DC : American Chemical Society, 1995.
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Washington, DC : American Chemical Society, 1995.
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Langelier, Wilfred F., creator.
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2018.006 |
INQUIRE @ DESK |
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Polak, Julia M.
Oxford ; New York : Oxford University Press ; Oxford : Royal Microscopical Society, 1987.
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Finnigan, Robert E., 1927- interviewee.
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Washington, DC : American Chemical Society, ©1998.
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New York : J. Wiley, ©1997.
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[Washington, D.C.] : American Chemical Society, 1988.
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Forest Products Symposium (1993 : Saint Louis, Mo.)
New York, N.Y. : American Institute of Chemical Engineers, 1994.
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Joint AOAC/FAO/IAEA/IUPAC International Workshop on the Principles and Practices of Method Validation (1999 : Budapest, Hungary)
Cambridge : Royal Society of Chemistry, ©2000.
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Boca Raton : CRC Press, 2011.
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Finnigan, Robert E., 1927-
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2013.036 |
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Philadelphia, PA : ASTM, c1989.
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Hoboken, New Jersey : John Wiley & Sons, Inc., [2013]
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Washington, D.C. : The Society, 1980.
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New York : Informa healthcare, ©2008.
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Washington, DC : American Chemical Society, 1993.
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International Conference on Chemical Process Control (6th : 2001 : Tucson, Ariz.)
[Austin, Tex.] : CACHE ; New York : American Institute of Chemical Engineers, 2002.
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International Conference on Intelligent Systems in Process Engineering (1st : 1995 : Snowmass, Colo.)
New York, N.Y. : American Institute of Chemical Engineers, 1996.
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Oreskes, Naomi.
New York: Oxford University Press, 1999.
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New York, N.Y. : American Institute of Chemical Engineers, 1988.
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Washington, D.C. : American Chemical Society, 1991.
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Washington, DC : American Chemical Society ; [New York] : Distributed by Oxford University Press, ©1998.
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Chichester [West Sussex] ; New York : Wiley, 1983.
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Park Ridge, N.J., U.S.A. : Noyes Publications, c1990.
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Albany : State University of New York Press, ©1986.
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International Conference on Chemical Process Control (5th : 1996 : Tahoe City, Calif.)
New York : American Institute of Chemical Engineers, 1997.
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Kim, Cherng-ju.
Boca Raton, Fla. : CRC Press, ©2004.
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Baker, Jeffrey J. W., compiler.
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International Conference on Chemical Process Control (3rd : 1986 : Asilomar, Calif.)
Amsterdam ; New York : Elsevier, 1986.
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International Conference on Chemical Process Control (4th : 1991 : Padre Island, Tex.)
Austin [Tex.] : CACHE ; New York : AIChE, 1991.
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International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing (2nd : 1997 : Montreal, Quebec)
Pennington, NJ : Electrochemical Society, c1997.
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Washington, DC : American Chemical Society ; [Cary, NC] : Distributed by Oxford University Press, ©2002.
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Cooper, C. David.
Prospect Heights, Ill.: Waveland Press, ©2002.
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CACHE (Organization)
Austin, Texas : CACHE, 1984.
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Symposium on Control, Diagnostics, and Modeling in Semiconductor Manufacturing (1st : 1995 : Reno, Nevada)
Pennington, NJ : Electrochemical Society, c1995.
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GB94:41 |
INQUIRE @ DESK |
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Burman, Birger F., creator.
Rating:
Archives Collections
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2000.039 |
INQUIRE @ DESK |
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Institute of Physics (Great Britain). Electron Microscopy and Analysis Group. Conference (2003 : University of Oxford)
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New York : McGraw-Hill, c1992.
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