The Online Books Page

Books by W. Murray Bullis:

Books in the extended shelves:

• Bullis, W. Murray, 1930-: Measurement methods for the semiconductor device industry - a summary of NBS activity. (for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1969) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Measurement of carrier lifetime in semiconductors : an annotated bibliography covering the period 1949-1967 (U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off., 1968), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semicaonductor materials, process control, and devices : quarterly report, January 1 to March 31, 1970 (U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1970), also by Institute for Applied Technology (U.S.) Electronic Technology Division and A. J. Baroody (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. (GPO, 1969) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 - June 30, 1973. (GPO, 1973) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 to June 30, 1969. (GPO, 1969) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 - June 30, 1971. (GPO, 1971) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 - June 30, 1972. (GPO, 1972) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. Jan. 1 - Mar. 31, 1972. (GPO, 1972) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report, January 1 to March 31, 1971. (GPO, 1971) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. January 1 - March 31, 1973. (GPO, 1973) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report July 1 to September 30, 1969. (GPO, 1970) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report, July 1 to Sept. 30, 1968. (Supt. of Docs., G.P.O., 1968), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. July 1 - September 30, 1972. (GPO, 1973) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices : quarterly report, July, 1 - Sept. 30, 1971 (Washington : GPO, 1971., 1971) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices. Quarterly report Oct. 1 to Dec. 31, 1969. (GPO, 1970) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Methods of measurement for semiconductor materials, process control, and devices quarterly report October 1 to december 31, 1968. (GPO, 1969) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1980), also by R. D. Larrabee, W. Robert Thurber, and Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1980) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology : [progress report] April 1, 1977 to September 30, 1977 (U.S. Dept. of Commerce, National Bureau of Standards, 1980), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology, April 1, 1977 to September 30, 1977 (U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology combined quarterly report, October 1, 1973, to March 31, 1974 (The Bureau :, 1974), also by United States Defense Advanced Research Projects Agency, United States. Defense Nuclear Agency, and United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology October 1, 1976 to March 31, 1977 (U.S. Dept. of Commerce, National Bureau of Standards :, 1979), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology: progress report, January 1 to June 30, 1975 (U.S. National Bureau of Standards, 1976) (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology : progress report, January 1 to June 30, 1976 (U.S. Dept. of Commerce, National Bureau of Standards, 1977), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology : progress report, July 1 to December 31, 1975 (U.S. Dept. of Commerce, National Bureau of Standards, 1976), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology : progress report, July 1 to September 30, 1976 (U.S. Dept. of Commerce, National Bureau of Standards :, 1978), also by United States. National Bureau of Standards and J. Franklin Mayo-Wells (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology : progress report, October 1 to December 31, 1974 (U.S. Dept. of Commerce, National Bureau of Standards ; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology : quarterly report, April 1 to June 30, 1974. (U.S. Dept. of Commerce, National Bureau of Standards :, 1974), also by United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology quarterly report, July 1 to September 30, 1973. (National Bureau of Standards ;, 1974), also by United States. Defense Nuclear Agency, United States Defense Advanced Research Projects Agency, and United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Semiconductor measurement technology : quarterly report, July 1 to September 30, 1974 (National Bureau of Standards :, 1975), also by United States. Navy Strategic Systems Projects Office, United States Defense Advanced Research Projects Agency, United States. Defense Nuclear Agency, and United States. National Bureau of Standards (page images at HathiTrust)
• Bullis, W. Murray, 1930-: Use of a time-shared computer system to control a Hall effect experiment (U.S. Dept. of Commerce, National Bureau of Standards, 1969), also by A. L. Koenig, F. H. Ulmer, T. N. Pyke, W. R. Thurber, Center for Computer Sciences and Technology. Information Processing Technology Division, Institute for Applied Technology (U.S.). Electronic Technology Division, and United States. National Bureau of Standards (page images at HathiTrust)

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