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Books by Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division:

Books in the extended shelves:

• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices (Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), also by David L. Blackburn and United States. Division of Electric Energy Systems (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: Large scale integration digital testing : annotated bibliography, 1969-1978 (U.S. Dept. of Commerce, National Bureau of Standards :, 1979), also by T. F. Leedy (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: Measurement techniques for high power semiconductor materials and devices : annual report (The Division ;, in the 20th century), also by Center for Electronics and Electrical Engineering (U.S.). Semiconductor Materials and Processes Division and United States. Division of Electric Energy Systems (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials (U.S. Dept. of Commerce, National Bureau of Standards :, 1979), also by Md.) Workshop on the Stability of (Thin Film) Solar Cells and Materials (1978 : Gaithersburg, Harry A. Schafft, David E. Sawyer, and United States. Dept. of Energy. Advanced Materials R & D Branch (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: Reliability technology for cardiac pacemakers III : a workshop report : report of a workshop held at the National Bureau of Standards, Gaithersburg, MD, October 19-20, 1977 (Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977), also by Harry A. Schafft (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1981), also by G. P. Carver and W. A. Cullins (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1980), also by R. D. Larrabee, W. Murray Bullis, and W. Robert Thurber (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1980), also by John M. Jerke and United States Defense Advanced Research Projects Agency (page images at HathiTrust)
• Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division: Spreading resistance analysis for silicon layers with nonuniform resistivity (Dept. of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), also by David H. Dickey, James R. Ehrstein, United States Defense Advanced Research Projects Agency, and Solecon Laboratories (page images at HathiTrust)

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