More about David H. Dickey:
| | Books by David H. Dickey: Books in the extended shelves: Dickey, David H.: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1979), also by James R. Ehrstein (page images at HathiTrust) Dickey, David H.: Spreading resistance analysis for silicon layers with nonuniform resistivity (Dept. of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), also by James R. Ehrstein, United States Defense Advanced Research Projects Agency, Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division, and Solecon Laboratories (page images at HathiTrust) Dickey, David H.: Spreading resistance analysis for silicon layers with nonuniform resistivity : David H. Dickey and James R. Ehrstein. (U.S. Dept. of Commerce, 1979), also by James R. Ehrestein (page images at HathiTrust)
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