The Online Books Page

Books by James R. Ehrstein:

Books in the extended shelves:

• Ehrstein, James R.: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1979), also by David H. Dickey (page images at HathiTrust)
• Ehrstein, James R.: Spreading resistance analysis for silicon layers with nonuniform resistivity (Dept. of Commerce, [Office of Science and Technology], National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979), also by David H. Dickey, United States Defense Advanced Research Projects Agency, Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division, and Solecon Laboratories (page images at HathiTrust)
• Ehrstein, James R.: Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 (U.S. Dept. of Commerce, National Bureau of Standards :, 1974), also by Md.) Spreading Resistance Symposium (1974 : Gaithersburg, United States. National Bureau of Standards, and American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics (page images at HathiTrust)

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