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Books by Institute for Applied Technology (U.S.). Electronic Technology Division:

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• Institute for Applied Technology (U.S.). Electronic Technology Division: Accelerometer calibration with the earth's field dynamic calibrator (U.S. Dept. of Commerce, National Bureau of Standards, 1970), also by John S. Hilten (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: The destructive bond pull test (U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976), also by John Albers, United States. Navy Strategic Systems Projects Office, and United States. Defense Nuclear Agency (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Development of dynamic calibration methods for pogo pressure transducers (Dept. of Commerce, National Bureau of Standards. Institute for Applied Technology, Electronic Technology Division :, 1976), also by John S. Hilten (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: The effects of extended high-temperature storage on the performance characteristics of several strain gage pressure transducers. (U.S. Dept. of Commerce, National Bureau of Standards ;, 1969), also by Randolph Williams and United States. National Bureau of Standards (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Experimental investigation of means for reducing the response of pressure transducers to thermal transients (U.S. Dept. of Commerce, National Bureau of Standards :, 1978), also by John S. Hilten and United States. Naval Air Systems Command (page images at HathiTrust)
• Institute for Applied Technology (U.S.) Electronic Technology Division: Methods of measurement for semicaonductor materials, process control, and devices : quarterly report, January 1 to March 31, 1970 (U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1970), also by A. J. Baroody and W. Murray Bullis (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Microelectronic interconnection bonding with ribbon wire (U.S. Dept. of Commerce, National Bureau of Standards, 1973), also by H. K. Kessler, A. H. Sher, United States. National Bureau of Standards, and United States. Advanced Research Projects Agency (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: A new dynamic pressure source for the calibration of pressure transducers (U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, 1976), also by Carol F. Vezzetti and Langley Research Center (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Nomographs for use in the fabrication and testing of Ge (Li) detectors (U.S. Dept. of Commerce, National Bureau of Standards, 1970), also by Alvin H. Sher and United States. National Bureau of Standards (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes (U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division :, 1976), also by James M. Kenney and United States. Defense Nuclear Agency (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division :, 1976), also by Harry A. Schafft, United States. Bureau of Medical Devices and Diagnostic Products, and Reliability Technology for Cardiac Pacemakers NBS/FDA Workshop (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Semiconductor measurement technology. Quarterly report. (U.S. Dept. of Commerce, National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.], 1973) (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Semiconductor measurement technology : reliability technology for cardiac pacemakers II, a workshop report (Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977), also by Reliability Technology for Cardiac Pacemakers II (1976 : National Bureau of Standards) and Harry A. Schafft (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Tabulation of published data on electron devices of the U.S.S.R. through March 1970 (U.S. Dept. of Commerce, National Bureau of Standards, 1970), also by Charles P. Marsden and United States. National Bureau of Standards (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: A test method for determining the effect of thermal transients on pressure-transducer response (U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division :, 1976), also by John S. Hilten, Sandia Laboratories, and United States. Naval Air Systems Command (page images at HathiTrust)
• Institute for Applied Technology (U.S.). Electronic Technology Division: Use of a time-shared computer system to control a Hall effect experiment (U.S. Dept. of Commerce, National Bureau of Standards, 1969), also by A. L. Koenig, F. H. Ulmer, T. N. Pyke, W. R. Thurber, W. Murray Bullis, Center for Computer Sciences and Technology. Information Processing Technology Division, and United States. National Bureau of Standards (page images at HathiTrust)

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