More about David E. Sawyer:
| | Books by David E. Sawyer: Books in the extended shelves: Sawyer, David E.: Heterodyne operation of avalanche photodiodes (National Aeronautics and Space Administration ;, 1967) (page images at HathiTrust) Sawyer, David E.: Measurement of transistor scattering parameters (U.S. Dept. of Commerce, National Bureau of Standards :, 1975), also by George J. Rogers and Ramon L. Jesch (page images at HathiTrust) Sawyer, David E.: NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials (U.S. Dept. of Commerce, National Bureau of Standards :, 1979), also by Md.) Workshop on the Stability of (Thin Film) Solar Cells and Materials (1978 : Gaithersburg, Harry A. Schafft, United States. Dept. of Energy. Advanced Materials R & D Branch, and Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division (page images at HathiTrust) Sawyer, David E.: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1976), also by David W. Berning (page images at HathiTrust) Sawyer, David E.: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1977), also by David W. Berning (page images at HathiTrust)
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