Books by W. Robert Thurber:
Books in the extended shelves:
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Thurber, W. Robert: Determination of deep impurities in silicon and germanium by infrared photoconductivity (U.S. National Bureau of Standards :, 1971) (page images at HathiTrust)- Thurber, W. Robert: Determination of oxygen concentration in silicon and germanium by infrared absorption (U.S. National Bureau of Standards :, 1970) (page images at HathiTrust)
- Thurber, W. Robert: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1981), also by J. J. Filliben, Y. M. Liu, and R. L. Mattis (page images at HathiTrust)
- Thurber, W. Robert: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1980), also by R. D. Larrabee, W. Murray Bullis, and Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division (page images at HathiTrust)
- Thurber, W. Robert: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1978), also by Martin G. Buehler (page images at HathiTrust)
Find more by W. Robert Thurber at your library, or elsewhere.