Title: | A wafer chuck for use between -196 and 350⁰C |
Author: | Koyama, R. Y. |
Author: | Buehler, Martin G. |
Author: | United States. Defense Advanced Research Projects Agency |
Author: | United States. Division of Electric Energy Systems |
Note: | U.S. Dept. of Commerce, National Bureau of Standards :, 1979 |
Link: | page images at HathiTrust |
No stable link: | This is an uncurated book entry from our extended bookshelves, readable online now but without a stable link here. You should not bookmark this page, but you can request that we add this book to our curated collection, which has stable links. |
Subject: | Probes (Electronic instruments) |
Subject: | Semiconductors -- Testing -- Equipment and supplies |
Other copies: | Look for editions of this book at your library, or elsewhere. |
Help with reading books -- Report a bad link -- Suggest a new listing
Home -- Search -- New Listings -- Authors -- Titles -- Subjects -- Serials
Books -- News -- Features -- Archives -- The Inside Story
Edited by John Mark Ockerbloom (onlinebooks@pobox.upenn.edu)
OBP copyrights and licenses.