The Online Books Page

Books by Martin G. Buehler:

Books in the extended shelves:

• Buehler, Martin G.: A BASIC program for calculating dopant density profiles from capacitance-voltage data (U.S. Dept. of Commerce, National Bureau of Standards :, 1975), also by Richard L. Mattis and United States. National Bureau of Standards (page images at HathiTrust)
• Buehler, Martin G.: Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script (U.S. Dept. of Commerce, National Bureau of Standards :, 1976) (page images at HathiTrust)
• Buehler, Martin G.: Microelectronic test pattern NBS-3 for evaluating the resistivity-dopant density relationship of silicon (U.S. Dept. of Commerce, National Bureau of Standards :, 1976) (page images at HathiTrust)
• Buehler, Martin G.: Planar test structures for characterizing impurities in silicon (U.S. Dept. of Commerce, National Bureau of Standards :, 1976) (page images at HathiTrust)
• Buehler, Martin G.: Semiconductor measurement technology. (U.S. Dept. of Commerce, National Bureau of Standards :, 1978), also by W. Robert Thurber (page images at HathiTrust)
• Buehler, Martin G.: Semiconductor measurement technology. (National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.], 1974), also by United States. Defense Nuclear Agency and United States Defense Advanced Research Projects Agency (page images at HathiTrust)
• Buehler, Martin G.: A wafer chuck for use between -196 and 350⁰C (U.S. Dept. of Commerce, National Bureau of Standards :, 1979), also by R. Y. Koyama, United States Defense Advanced Research Projects Agency, and United States. Division of Electric Energy Systems (page images at HathiTrust)

Find more by Martin G. Buehler at your library, or elsewhere.