| Title: | Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script |
| Author: | Buehler, Martin G. |
| Note: | U.S. Dept. of Commerce, National Bureau of Standards :, 1976 |
| Link: | page images at HathiTrust |
| No stable link: | This is an uncurated book entry from our extended bookshelves, readable online now but without a stable link here. You should not bookmark this page, but you can request that we add this book to our curated collection, which has stable links. |
| Subject: | Capacitors -- Defects |
| Subject: | Condensateurs électriques -- Défauts |
| Subject: | Cryostats |
| Subject: | Electric measurements |
| Subject: | Semiconducteurs -- Jonctions -- Défauts |
| Subject: | Semiconductors -- Junctions -- Defects |
| Other copies: | Look for editions of this book at your library, or elsewhere. |
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